NPD Reports

Beyond the Scrum Team: Delivering "Done" at Scale
sponsored by Tasktop
WEBCAST: Watch this webcast to find out how you can derive more value from your scrum teams. Find out how to identify, anticipate, and mitigate the challenges to scaling agile development. Plus, learn how to incorporate scrum into the full product lifecycle, from development to operations and insight.
Posted: 27 Jul 2016 | Premiered: Jul 26, 2016

Tasktop

TestStand 2.0.1 – Reducing the Cost of Manufacturing Test
sponsored by National Instruments
WHITE PAPER: With TestStand, manufacturing test developers create automated test systems that dramatically reduce the cost of testing products by increasing throughput and reducing test development time.
Posted: 30 Apr 2002 | Published: 01 Apr 2002

National Instruments

Aberdeen Group: The 2011 Growth Imperative: Optimizing Speed and Cost in New Product Development
sponsored by IBM
ANALYST REPORT: This Aberdeen Business Review found that over one half of manufacturers are focused on profitability and margin growth.  The review offers insight into how leading companies are approaching the task to excel in innovation and new product development despite lean organizations budgets.
Posted: 10 Nov 2011 | Published: 31 Oct 2010

IBM

Creating and managing value-driven product portfolios
sponsored by IBM
WHITE PAPER: The product portfolio decisions you make today will determine whether your company is relevant tomorrow. To increase the chances of marketing a successful product, organizations must deliver products and services to the consumers they value the most, and they must provide those deliverables when their consumers want them. Read on to learn more.
Posted: 24 Jul 2009 | Published: 23 Jun 2009

IBM

Presentation Transcript: Getting More Out of your Development Testing
sponsored by Electric Cloud
PRESENTATION TRANSCRIPT: Consult this presentation transcript to learn more about how you can improve your development testing. It outlines best practices, processes, infrastructure and other helpful tips. Get the important answers you need in regards to development testing and static analysis by reading this resource now.
Posted: 06 Dec 2012 | Published: 06 Dec 2012

Electric Cloud

The Agile Project Manager
sponsored by VersionOne Inc.
WHITE PAPER: This white paper will explore the impact agile development methodologies are having on the Project Management community, what new skills are required, and what the Project Manager can do to ease the transition.
Posted: 08 Jun 2009 | Published: 08 Jun 2009

VersionOne Inc.

APIs Drive Opportunity Explosion
sponsored by Intel® Services
WHITE PAPER: Learn how leading UK retailer, Argos, increased sales by via mobile apps by 125% by leveraging a robust API management platform.
Posted: 11 Apr 2014 | Published: 11 Apr 2014

Intel® Services

Windows 10 Momentum Continues to Build
sponsored by Flexera Software
EGUIDE: In this expert e-guide, we examine how Windows 10 is growing as a highly productive development environment. Find out how the OS is generating new opportunities for developers and how it's impacting Microsoft's future in cloud, mobile, and more.
Posted: 31 Aug 2016 | Published: 31 Aug 2016

Flexera Software

Object Persistence and Agile Software Development
sponsored by Versant Corp.
WHITE PAPER: Agile Software Development is one of the most effective methodologies to develop application software. This paper examines and compares RDBMS with several object persistence methods within the context of Agile Software Development by quantifying the impact of these methods on the velocity and success of an agile application development project.
Posted: 03 Mar 2010 | Published: 01 Dec 2009

Versant Corp.

Improving Manufacturing Quality with Integrated Test and Statistical Analysis
sponsored by National Instruments
WHITE PAPER: With test management and statistical analysis integrated into an automated system, organizations can target problem components and processes in less time with more accuracy, reducing the cost of manufacturing quality products.
Posted: 01 Dec 2002 | Published: 01 Nov 2002

National Instruments